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Standard Practice for Radiographic Examination Using Digital Detector Arrays (Includes all amendments and changes 9/26/2018).
Name übersetzen
NORM herausgegeben am 1.2.2018
Bezeichnung normen: ASTM E2698-18e1
Ausgabedatum normen: 1.2.2018
SKU: NS-897990
Zahl der Seiten: 11
Gewicht ca.: 33 g (0.07 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
amorphous silicon, digital detector array, image processing, image quality indicator, nondestructive testing, penetrating radiation, radiography, radiographic examination, X-ray,, ICS Number Code 11.040.50 (Radiographic equipment)
Significance and Use | ||||||||||||||||||||||||||||||
4.1 This practice establishes the basic parameters for the application and control of the digital detector array radiographic method. This practice is written so it can be specified on the engineering drawing, specification, or contract. It will require a detailed procedure delineating the technique or procedure requirements and shall be approved by the Cognizant Engineering Organization (CEO). |
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1. Scope | ||||||||||||||||||||||||||||||
1.1 This practice establishes the minimum requirements for radiographic examination of metallic and nonmetallic materials using digital detector arrays (DDAs). 1.2 The stated requirements of this specification are based on the use of an X-ray generating source. Additionally, some of the tests and requirements may not be applicable to X-ray energy levels >450kV. 1.3 The requirements in this practice are intended to control the quality of radiographic examinations obtained using DDAs and are not intended to establish acceptance criteria for parts or materials. 1.4 This practice covers the radiographic examination with DDAs including DDAs described in Practice E2597/E2597M such as a device that contains a photoconductor attached to a Thin Film Transistor (TFT) read out structure, a device that has a phosphor coupled directly to an amorphous silicon read-out structure, and devices where a phosphor is coupled to a CMOS (complementary metal–oxide–semiconductor) array, or a CCD (charge coupled device) crystalline silicon read-out structure. 1.5 The requirements of this practice and Practice E2737 shall be used together. The requirements of Practice E2737 will provide the baseline evaluation and long term stability test procedures for the DDA system. The user of the DDA system shall establish a written procedure that addresses the specific requirements and tests to be used in their application and shall be approved by the Cognizant Radiographic Level 3 before examination of production hardware. This practice also requires the user to perform a system qualification suitable for its intended purpose and to issue a system qualification report (see 9.1). 1.6 The DDA shall be selected for an NDT application based on knowledge of the technology described in Guide E2736, and of the selected DDA properties provided by the manufacturer in accordance with Practice E2597/E2597M. 1.7 Techniques and applications employed with DDAs are diverse. This practice is not intended to be limiting or restrictive. Refer to Guides E94/E94M, E1000, and E2736, Terminology E1316, Practices E747 and E1025, and Federal Standards 21-CFR-1020.40 and 29-CFR-1910.96 for a list of documents that provide additional information and guidance. 1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. |
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2. Referenced Documents | ||||||||||||||||||||||||||||||
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