ASTM E2382-04(2020)

Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

NORM herausgegeben am 1.12.2020

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The information about the standard:

Designation standards: ASTM E2382-04(2020)
Publication date standards: 1.12.2020
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM E2382-04(2020) :

Keywords:
Abbe offset error, creep, dilation, hysteresis, nonlinearity, probe-sample mixing, AFM, STM, tip shape, proximal probe, geometric mixing, image reconstruction,, ICS Number Code 17.040.20 (Properties of surfaces)