IEC 62951-3-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

NORM herausgegeben am 7.11.2018

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The information about the standard:

Designation standards: IEC 62951-3-ed.1.0
Publication date standards: 7.11.2018
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: International technical standard
Kategorie: Technische Normen IEC

Annotation of standard text IEC 62951-3-ed.1.0 :

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.