Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
NORM herausgegeben am 29.3.2023
Bezeichnung normen: IEC 63287-2-ed.1.0
Ausgabedatum normen: 29.3.2023
Zahl der Seiten: 30
Gewicht ca.: 90 g (0.20 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEC
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications. L’IEC 63287-2:2023 fournit des lignes directrices pour lelaboration de plans de qualification de la fiabilite a l’aide du concept de profil de mission, sur la base des conditions environnementales et de l’utilisation prevue du produit. Le present document n’est pas destine aux applications militaires et spatiales.